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Volumn 38, Issue 19, 2003, Pages 4055-4063

Dielectric properties of nanostructured nickel oxide

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DIELECTRIC LOSSES; DIELECTRIC RELAXATION; NICKEL COMPOUNDS; PARTICLE SIZE ANALYSIS; SCREENING;

EID: 0242569484     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026131103898     Document Type: Article
Times cited : (55)

References (50)
  • 24
    • 0042755325 scopus 로고
    • edited by Morris Cohen (Addison-Wesley Publishing Company Inc.)
    • B. D. CULLITY, in "X-ray Diffraction," edited by Morris Cohen (Addison-Wesley Publishing Company Inc., 1959) p. 99.
    • (1959) X-ray Diffraction , pp. 99
    • Cullity, B.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.