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Volumn 38, Issue 19, 2003, Pages 4055-4063
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Dielectric properties of nanostructured nickel oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
DIELECTRIC LOSSES;
DIELECTRIC RELAXATION;
NICKEL COMPOUNDS;
PARTICLE SIZE ANALYSIS;
SCREENING;
INTERFACIAL REGION;
NANOSTRUCTURED MATERIALS;
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EID: 0242569484
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1026131103898 Document Type: Article |
Times cited : (55)
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References (50)
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