Diffraction contrast imaging using virtual apertures

Ultramicroscopy

Volumn 155, Issue , 2015, Pages 1-10

  Gammer, Christoph ^a,b,c   Burak Ozdol, V ^a   Liebscher, Christian H ^a,b   Minor, Andrew M ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b University of California Berkeley   (United States)

^c UNIVERSITY OF VIENNA   (Austria)

Author keywords

Dark field scanning; Diffraction imaging; Large data; Nanodiffraction; Precipitates; Virtual microscopy

Indexed keywords

CRYSTAL STRUCTURE; DIFFRACTION PATTERNS; IMAGE RECONSTRUCTION; INTERFEROMETRY; PRECIPITATES; PRECIPITATION (CHEMICAL);

DARK FIELD; DIFFRACTION IMAGING; LARGE DATA; NANODIFFRACTION; VIRTUAL MICROSCOPY;

IMAGE PROCESSING;

ALLOY; FERRITIC ALLOY; UNCLASSIFIED DRUG;

ARTICLE; BINOCULAR CONVERGENCE; CONTRAST RADIOGRAPHY; CONTROLLED STUDY; CRYSTAL STRUCTURE; DARK FIELD MICROSCOPY; DARK FIELD SCANNING; DIFFRACTION; DIFFRACTION CONTRAST IMAGING; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; LIGHT SCATTERING; MICROSCOPY; PRECIPITATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCINTISCANNING; TRANSMISSION ELECTRON MICROSCOPY; VIRTUAL MICROSCOPY;

EID: 84925956733     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2015.03.015     Document Type: Article

References (26)

1. Hirsch P.B., Howie A., Whelan M.J. Philos. Trans. R. Soc. A 1960, 252:499.
2. Bell W., Thomas G. Phys. Status Solidi 1965, 12:843.
3. Yamaguchi S., Watanabe D., Ogawa S. J. Phys. Soc. Jpn. 1962, 17:1030.
4. Haider M., Epstein A., Jarron P., Boulin C. Ultramicroscopy 1994, 54:41.
5. Shibata N., Kohno Y.J. Electron. Microsc. 2010, 59:473.
6. Jesson D., Pennycook S. Proc. R. Soc. Lond. A 1995, 449:273.
7. Phillips P., Brandes M., Mills M., Graef M.De Ultramicroscopy 2011, 111:1483.
8. Jácome L.A., Eggeler G., Dlouhý A. Ultramicroscopy 2012, 122:48.
9. Perovic D., Rossouw C., Howie A. Ultramicroscopy 1993, 52:353.
10. Alloyeau D., Ricolleau C., Oikawa T., Langlois C., Le Bouar Y., Loiseau A. Ultramicroscopy 2008, 108:656.
11. Hirata A., Guan P., Fujita T., Hirotsu Y., Inoue A., Yavari A.R., Sakurai T., Chen M. Nat. Mater. 2011, 10:28.
12. Rodenburg J., McCallum B., Nellist P. Ultramicroscopy 1993, 48:304.
13. Cowley J. Microsc. Microanal. 2004, 10:9.
14. Schaffer B., Gspan C., Grogger W., Kothleitner G., Hofer F. Microsc. Microanal. 2008, 14(Suppl. 2):S70.
15. Vo N., Liebscher C., Rawlings M., Asta Mark, Dunanda D.C. Acta Mater. 2014, 71:89.
16. Koch C., Özdöl V., Ishizuka K. Microsc. Anal. 2012, May:5.
17. Koch C. Ultramicroscopy 2011, 111:828.
18. Dingley D.J. Microchim. Acta 2006, 155:19.
19. Abraham D.P., Richardson J.W., McDeavitt S.M. Scr. Mater. 1997, 37:239.
20. Cockayne D.J.H., Chen Y., Li G., Borisenko K.B.J. Phys. Conf. Ser. 2010, 241:012006.
21. Williams D.B., Carter C.B. Transmission Electron Microscopy: A Textbook for Materials Science 2009, vol. 2. Springer.
22. Schlossmacher P., Klenov D., Freitag B., Harrach h s von Microsc. Today 2010, 18:14.
23. Zaefferer S. Cryst. Res. Technol. 2011, 46:607.
24. Liu H., Schmidt S., Poulsen H., Godfrey A. Science 2011, 80:833. 332.
25. Müller K., Rosenauer A., Schowalter M., Zweck J., Fritz R., Volz K. Microsc. Microanal. 2012, 18:995.
26. Hofmann F., Song X., Jun T., Abbey B. Mater. Lett. 2010, 64:1302.