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Nanoscale

Volumn 7, Issue 12, 2015, Pages 5169-5177

Engineering of nanoscale defect patterns in CeO2 nanorods via ex situ and in situ annealing

(6) Sakthivel, Tamil Selvan a Reid, David L a Bhatta, Umananda M b,d Möbus, Günter b Sayle, Dean C c Seal, Sudipta a

a UNIVERSITY OF CENTRAL FLORIDA (United States)

b UNIVERSITY OF SHEFFIELD (United Kingdom)

c UNIVERSITY OF KENT (United Kingdom)

d JAIN UNIVERSITY (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CERIUM OXIDE; CRYSTALLINE MATERIALS; DEFECTS;

CRYSTALLINE QUALITY; HYDROTHERMAL PROCESS; IN-SITU ANNEALING; LATTICE STRAIN; NANOSCALE DEFECTS; POLYHEDRAL MORPHOLOGIES; SHAPED DEFECTS; SINGLE-CRYSTALLINE;

NANORODS;

EID: 84924957542 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c4nr07308h Document Type: Article

Times cited : (58)

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