Defect structures in doped CeO2 studied by using XAFS spectrometry

Solid State Ionics

Volumn 136-137, Issue , 2000, Pages 913-920

  Yamazaki, Satoshi ^a   Matsui, Tsuneo ^a   Ohashi, Toyo ^a   Arita, Yuji ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CERIUM COMPOUNDS; DOPING (ADDITIVES); OXIDATION; POINT DEFECTS; SPECTROMETRY;

CERIA; EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; VACANCIES; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

SOLID ELECTROLYTES;

EID: 0034318850     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(00)00569-5     Document Type: Article

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