A nonlinear filtering algorithm for denoising HR(S)TEM micrographs

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 62-67

  Du, Hongchu ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Denoising; Filtering; HR(S)TEM; Image processing; Noise reduction; Nonlinear filter

Indexed keywords

ALGORITHMS; DEFECTS; ELECTRON MICROSCOPY; FILTRATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE PROCESSING; LOW PASS FILTERS; NOISE ABATEMENT; NONLINEAR FILTERING; SCANNING ELECTRON MICROSCOPY; SIGNAL FILTERING AND PREDICTION; TRANSMISSION ELECTRON MICROSCOPY;

ACCURATE QUANTIFICATIONS; ATOMIC RESOLUTION; DE-NOISING; IN-SITU ANALYSIS; NOISE REDUCTION ALGORITHMS; NONLINEAR FILTERING ALGORITHM; QUANTITATIVE ELECTRON MICROSCOPY; VISUAL QUALITIES;

IMAGE DENOISING;

ALGORITHM; ARTICLE; ARTIFACT; FILTER; FILTRATION; HIGH RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPY; MEASUREMENT ACCURACY; NOISE REDUCTION; NONLINEAR SYSTEM; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 84924786943     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.11.012     Document Type: Article

References (21)

1. Jia C.L., Urban K. Atomic-resolution measurement of oxygen concentration in oxide materials. Science 2004, 303(5666):2001-2004. 10.1126/science.1093617.
2. Batson P.E., Dellby N., Krivanek O.L. Sub-angstrom resolution using aberration corrected electron optics. Nature 2002, 418(6898):617-620. 10.1038/nature00972.
3. Zuo J.M. Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration. Microsc. Res. Tech. 2000, 49(3):245-268. URL http://people.iom.cnr.it/carlino/Gladich/detector_zuo_ccd.pdf.
4. Lim J.S. Two-Dimensional Signal and Image Processing 1990, Prentice-Hall, Inc., Upper Saddle River, NJ, USA.
5. De Jong A., Coene W., Van Dyck D. Image processing of HRTEM images with non-periodic features. Ultramicroscopy 1989, 27(1):53-65. 10.1016/0304-3991(89)90200-3.
6. Marks L. Wiener-filter enhancement of noisy HREM images. Ultramicroscopy 1996, 62(12):43-52. 10.1016/0304-3991(95)00085-2.
7. Kilaas R. Optimal and near-optimal filters in high-resolution electron microscopy. J. Microsc. 1998, 190(1-2):45-51. 10.1046/j.1365-2818.1998.3070861.x.
8. Ishizuka K., Eilers P., Kogure T. Optimal noise filters in high-resolution electron microscopy. Microsc. Microanal. 2007, 13(Supplement S02):902-903. 10.1017/S1431927607073060.
9. Lin F., Jin C. An improved wiener deconvolution filter for high-resolution electron microscopy images. Micron 2013, 50:1-6. 10.1016/j.micron.2013.03.005.
10. Krivanek O.L., Chisholm M.F., Nicolosi V., Pennycook T.J., Corbin G.J., Dellby N., Murfitt M.F., Own C.S., Szilagyi Z.S., Oxley M.P., Pantelides S.T., Pennycook S.J. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 2010, 464(7288):571-574. 10.1038/nature08879.
11. Krivanek O.L., Chisholm M.F., Murfitt M.F., Dellby N. Scanning transmission electron microscopy. Albert crewe's vision and beyond. Ultramicroscopy 2012, 123:90-98. 10.1016/j.ultramic.2012.04.004.
12. Kimoto K., Asaka T., Yu X., Nagai T., Matsui Y., Ishizuka K. Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy. Ultramicroscopy 2010, 110(7):778-782. 10.1016/j.ultramic.2009.11.014.
13. Berkels B., Binev P., Blom D.A., Dahmen W., Sharpley R.C., Vogt T. Optimized imaging using non-rigid registration. Ultramicroscopy 2014, 138:46-56. 10.1016/j.ultramic.2013.11.007.
14. A.B. Yankovich, B. Berkels, W. Dahmen, P. Binev, S. I. Sanchez, S.A. Bradley, A. Li, I. Szlufarska, P.M. Voyles, Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts, Nat. Commun. 5. doi:10.1038/ncomms5155.
15. Galindo P.L., Kret S., Sanchez A.M., Laval J.-Y., Yez A., Pizarro J., Guerrero E., Ben T., Molina S.I. The peak pairs algorithm for strain mapping from HRTEM images. Ultramicroscopy 2007, 107(12):1186-1193. 10.1016/j.ultramic.2007.01.019.
16. R. Erni, M. Rossell, C. Kisielowski, U. Dahmen, Atomic-resolution imaging with a sub-50-pm electron probe, Phys. Rev. Lett. 102(9). doi:10.1103/PhysRevLett.102.096101.
17. J. McNames, B. Goldstein, A nonlinear lowpass filter that eliminates peak attenuation, in: IEEE International Conference on Acoustics, Speech, and Signal Processing (ICASSP), 2002, vol. 2, IEEE, 2002, pp. II-1529. URL. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5744905.
18. Urban K.W., Mayer J., Jinschek J.R., Neish M.J., Lugg N.R., Allen L.J. Achromatic elemental mapping beyond the nanoscale in the transmission electron microscope. Phys. Rev. Lett. 2013, 110:185507. 10.1103/PhysRevLett.110.185507.
19. Forbes B., Houben L., Mayer J., Dunin-Borkowski R., Allen L. Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy. Ultramicroscopy 2014, 147:98-105. 10.1016/j.ultramic.2014.07.002.
20. C.B. Markwardt, Non-linear least squares fitting in IDL with MPFIT, in: D.A. Bohlender, D. Durand, P. Dowler (Eds.), Astronomical Data Analysis Software and Systems XVIII, Vol. 411, ASP Conference Series, Astronomical Society of the Pacific, 2009, pp. 251-254,. http://aspbooks.org/custom/publications/paper/411-0251.html.
21. J. Moré, The Levenberg-Marquardt algorithm: Implementation and theory, in: G.A. Watson (Ed.), Numerical Analysis, Vol. 630, Lecture Notes in Mathematics, Springer Berlin Heidelberg, 1978, pp. 105-116, isbn: 978-3-540-08538-6,. http://dx.doi.org/10.1007/BFb0067700.