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Volumn 23, Issue 4, 2015, Pages 470-478

A comparison between thin film solar cells made from co-evaporated CuIn1-xGaxSe2 using a one-stage process versus a three-stage process

Author keywords

3 stage (three stage); co evaporation; Cu(In Ga)Se2 (CIGS); in line; multistage; one stage; photovoltaics; thin film solar cells

Indexed keywords

CAPACITANCE; COPPER ALLOYS; COPPER METALLOGRAPHY; FILM PREPARATION; GALLIUM; GALLIUM ALLOYS; GLOW DISCHARGES; INDIUM ALLOYS; INDIUM METALLOGRAPHY; MORPHOLOGY; OPTICAL EMISSION SPECTROSCOPY; QUANTUM EFFICIENCY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR ALLOYS; SOLAR POWER GENERATION; THIN FILMS;

EID: 84924435509     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2453     Document Type: Article
Times cited : (59)

References (35)
  • 20
    • 18444397765 scopus 로고    scopus 로고
    • The effect of Ga-grading in CIGS thin film solar cells
    • Lundberg O, Edoff M, Stolt L,. The effect of Ga-grading in CIGS thin film solar cells. Thin Solid Films 2005; 480-481: 520-525.
    • (2005) Thin Solid Films , vol.480-481 , pp. 520-525
    • Lundberg, O.1    Edoff, M.2    Stolt, L.3
  • 29
    • 0032620403 scopus 로고    scopus 로고
    • Direct evidence of Cd diffusion into Cu(In, Ga)Se2 thin films during chemical-bath deposition process of CdS films
    • Nakada T,;, Kunioka A,. Direct evidence of Cd diffusion into Cu(In, Ga)Se2 thin films during chemical-bath deposition process of CdS films. Applied Physics Letters 1999; 74: 2444. doi: 10.1063/1.123875.
    • (1999) Applied Physics Letters , vol.74 , pp. 2444
    • Nakada, T.1    Kunioka, A.2
  • 32
    • 80052170449 scopus 로고    scopus 로고
    • 2 solar cells
    • 2 solar cells. Thin Solid Films 2011; 519: 7472-7475.
    • (2011) Thin Solid Films , vol.519 , pp. 7472-7475
    • Scheer, R.1
  • 34
    • 0016048780 scopus 로고
    • Influence of deep traps on the measurement of free-carrier distributions in semiconductors by junction capacitance techniques
    • Kimerling LC,. Influence of deep traps on the measurement of free-carrier distributions in semiconductors by junction capacitance techniques. Journal of Applied Physics 1974; 45: 1839.
    • (1974) Journal of Applied Physics , vol.45 , pp. 1839
    • Kimerling, L.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.