Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

Applied Physics Letters

Volumn 106, Issue 6, 2015, Pages

  Eckert, S ^a   Beye, M ^a   Pietzsch, A ^a   Quevedo, W ^a   Hantschmann, M ^a   Ochmann, M ^b,f   Ross, M ^c   Minitti, M P ^d   Turner, J J ^d   Moeller, S P ^d   Schlotter, W F ^d   Dakovski, G L ^d   Khalil, M ^c   Huse, N ^b,f   Fohlisch A ^a,e  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

^c UNIVERSITY OF WASHINGTON   (United States)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^e UNIVERSITY OF POTSDAM   (Germany)

^f MAX PLANCK INSTITUTE FOR THE STRUCTURE AND DYNAMICS OF MATTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FREE ELECTRON LASERS; OPTICAL PROPERTIES; REFLECTION; REFRACTIVE INDEX;

CROSS CORRELATION TECHNIQUES; CROSS CORRELATIONS; DETECTION SCHEME; FEMTOSECONDS; OPTICAL REFLECTIVITY; SOLID SAMPLES; ULTRA-FAST; X-RAY FREE ELECTRON LASERS;

OPTICAL CORRELATION;

EID: 84923884483     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4907949     Document Type: Article

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