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Volumn 8, Issue 9, 2014, Pages 706-709

Sub-femtosecond precision measurement of relative X-ray arrival time for free-electron lasers

Author keywords

[No Author keywords available]

Indexed keywords

FREE ELECTRON LASERS; LIGHT SOURCES; X RAY OPTICS;

EID: 84906948742     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2014.164     Document Type: Article
Times cited : (123)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.