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Volumn 189, Issue 3, 2015, Pages 163-176

Alignment of direct detection device micrographs using a robust Optical Flow approach

Author keywords

Beam induced motion; Direct detection devices; Electron microscopy; Single particle analysis

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER PROGRAM; COMPUTER SIMULATION; CRYOELECTRON MICROSCOPY; MOTION; OPTIC FLOW; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SPATIAL ANALYSIS; CHEMISTRY; DEVICES; IMAGE PROCESSING; ORTHOMYXOVIRIDAE; PROCEDURES; RIBOSOME;

EID: 84923447206     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2015.02.001     Document Type: Article
Times cited : (52)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.