Noise models and cryo-EM drift correction with a direct-electron camera

Ultramicroscopy

Volumn 131, Issue , 2013, Pages 61-69

  Shigematsu, H ^a   Sigworth, F J ^a  

^a YALE UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

Cross correlation function; Electron cryomicroscopy; Transmission electron microscopy

Indexed keywords

ACTIVE-PIXEL SENSORS; CROSS CORRELATIONS; CROSS-CORRELATION FUNCTION; DRIFT CORRECTION; ELECTRON CRYO MICROSCOPIES; HIGHLY-CORRELATED; LOW-DOSE EXPOSURES; SINGLE-PARTICLE;

CAMERAS; MEDICAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

PIXELS;

ARTICLE; CAMERA; CONTROLLED STUDY; CORRELATION ANALYSIS; CRYOELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; NOISE; NONBIOLOGICAL MODEL; PIXEL NOISE MODEL; SENSOR; SPECTRUM;

EID: 84880273391     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.04.001     Document Type: Article

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