Scanning tunneling microscopy evidences for surface electron scattering by underlying atoms

Carbon

Volumn 84, Issue C, 2015, Pages 74-81

  Wang, Junting ^a,b   Ge, Weifeng ^a,b   Hou, Yubin ^a   Lu, Qingyou ^a,b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DISLOCATIONS; ELECTRON SCATTERING; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY;

ATOMIC LEVELS; ELECTRON WAVE; INTERFERENCE MODELING; INTERLAYER INTERACTIONS; LATTICE SITES; SECOND LAYER; THERMAL PROCESS; VARIABLE INTERACTION;

ATOMS;

EID: 84923327189     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2014.11.046     Document Type: Article

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