Deterministic arbitrary switching of polarization in a ferroelectric thin film

Nature Communications

Volumn 5, Issue , 2014, Pages

  Vasudevan, R K ^a   Matsumoto, Y ^b,c   Cheng, Xuan ^d   Imai, A ^c,d   Maruyama, S ^b   Xin, H L ^e   Okatan, M B ^a   Jesse, S ^a   Kalinin, S V ^a   Nagarajan, V ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b TOHOKU UNIVERSITY   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^d UNIVERSITY OF NEW SOUTH WALES   (Australia)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCOMPOSITE;

ATOMIC FORCE MICROSCOPY; BISMUTH; CRYSTALLOGRAPHY; FILM; POLARIZATION; SYMMETRY; TITANIUM;

ARTICLE; DATA STORAGE DEVICE; DENSITY; ELECTRIC POTENTIAL; ELECTRICAL PARAMETERS; FILM; MICROSCOPY; PIEZOELECTRICITY; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION; ROTATION; STATIC ELECTRICITY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84923324083     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms5971     Document Type: Article

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