Directed assembly of nano-scale phase variants in highly strained BiFeO 3 thin films

Journal of Applied Physics

Volumn 112, Issue 6, 2012, Pages

  Zhou, Jian ^a   Trassin, Morgan ^a   He, Qing ^b   Tamura, Nobumichi ^b   Kunz, Martin ^b   Cheng, Chun ^a   Zhang, Jinxing ^a,d   Liang, Wen I ^c   Seidel, Jan ^b   Hsin, Cheng Lun ^c,e   Wu, Junqiao ^a,b  

^a University of California Berkeley   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d BEIJING NORMAL UNIVERSITY   (China)

^e NATIONAL CENTRAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE DEVICES; DIRECTED ASSEMBLY; ELASTIC ENERGY; ELECTROSTATIC ENERGIES; HIGHLY STRAINED; IN-PLANE ELECTRIC FIELDS; MIXED PHASE; NANO SCALE; PHASE DOMAIN; PHASE VARIANTS; PHOTOVOLTAIC DEVICES; WELL-DEFINED STRUCTURES;

ELECTRIC FIELDS; ELECTROMECHANICAL DEVICES; NANOTECHNOLOGY; VIRTUAL STORAGE;

THIN FILMS;

EID: 84867077448     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4752395     Document Type: Article

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28. See supplementary material at http://dx.doi.org/10.1063/1.4752395 E-JAPIAU-112-113218 for device fabrication, more comprehensive planar electrode switching, micro-X ray diffraction and X-ray magnetic circular dichroism.