Elucidating the crucial role of hole injection layer in degradation of organic light-emitting diodes

ACS Applied Materials and Interfaces

Volumn 7, Issue 5, 2015, Pages 3117-3125

  Han, Tae Hee ^a   Song, Wonjun ^b   Lee, Tae Woo ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Samsung Display Co   (South Korea)

Author keywords

degradation; device stability; hole injection interface; organic light emitting diodes

Indexed keywords

DEGRADATION; DIODES; ELECTRON INJECTION; ENERGY BARRIERS; ENERGY EFFICIENCY;

DEGRADATION MECHANISM; DEVICE STABILITY; HOLE INJECTION; HOLE INJECTION LAYERS; LUMINOUS EFFICIENCY; NON-DESTRUCTIVE ANALYSIS; OPERATIONAL LIFETIME; ORGANIC LIGHT EMITTING DIODES(OLEDS);

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 84922771799     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am5072628     Document Type: Article

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