Differential mobility spectrometry-mass spectrometry for atomic analysis

Analytical Chemistry

Volumn 87, Issue 3, 2015, Pages 1685-1693

  Sinatra, Francy L ^a   Wu, Tianpeng ^b   Manolakos, Spiros ^a   Wang, Jing ^b   Evans Nguyen, Theresa G ^a  

^a Draper Laboratory   (United States)

^b University of South Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CESIUM; FRACTIONATION; ION MOBILITY SPECTROMETERS; MASS SPECTROMETRY; SEPARATION; SPECTROMETRY;

ALPHA PARAMETERS; ANALYTICAL TREATMENT; DIFFERENTIAL MOBILITY SPECTROMETRIES; DIFFERENTIAL MOBILITY SPECTROMETRY; FORENSIC APPLICATIONS; ION MOBILITY SPECTROMETRY; MOLECULAR COMPONENTS; PORTABLE INSTRUMENT;

IONS;

EID: 84922239162     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac503466s     Document Type: Article

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