Chemical effects in the separation process of a differential mobility/Mass spectrometer system

Analytical Chemistry

Volumn 82, Issue 5, 2010, Pages 1867-1880

  Schneider, Bradley B ^a,b   Covey, Thomas R ^a,b   Coy, Stephen L ^a,b   Krylov, Evgeny V ^a,b   Nazarov, Erkinjon G ^a,b  

^a MDS Analytical Technologies   (Canada)

^b Sionex Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL EFFECT; CHEMICAL INTERACTIONS; CLUSTER-FORMATION MODEL; COMPENSATION VOLTAGE; DIFFERENTIAL MOBILITY; DIFFERENTIAL MOBILITY SPECTROMETERS; DIFFERENTIAL MOBILITY SPECTROMETRY; DYNAMIC CLUSTER; FIELD DEPENDENCE; HIGH-FIELD; HIGH-FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTROMETRIES; LOW FIELD MOBILITY; PEAK CAPACITY; PEAK WIDTHS; PHYSICAL MECHANISM; POLAR MODIFIER; SEPARATION POWER; SEPARATION PROCESS;

ELECTRIC FIELDS; HELIUM; IONS; SECURITY OF DATA; SPECTROMETERS; SPECTROMETRY; SPECTROSCOPIC ANALYSIS;

INERT GASES;

ARTICLE; INSTRUMENTATION; MASS SPECTROMETRY;

MASS SPECTROMETRY;

EID: 77749302232     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac902571u     Document Type: Article

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