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Volumn 25, Issue 10, 2010, Pages 1546-1566

Atomic spectrometry updates: A 25-year retrospective

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROMETRY; EDITORIAL BOARD;

EID: 77957170962     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c005518m     Document Type: Article
Times cited : (21)

References (223)
  • 178
  • 194
    • 77957128327 scopus 로고    scopus 로고
    • Electrospray ionization mass spectrometry: A complementary source for trace element speciation analysis. in
    • Hill, S. J. (Ed.) Blackwell Publishing
    • H. R. Hansen and S. A. Pergantis., Electrospray ionization mass spectrometry: A complementary source for trace element speciation analysis. In, Hill, S. J., (Ed.) Inductively Coupled Plasma Spectrometry and its Applications. Blackwell Publishing 2007, pp 251-276
    • (2007) Inductively Coupled Plasma Spectrometry and Its Applications. , pp. 251-276
    • Hansen, H.R.1    Pergantis, S.A.2
  • 216
    • 77957148207 scopus 로고    scopus 로고
    • H. M. S. Kingston; D. W. Huo; Y. S. Lu; S. Chalk
    • H. M. S. Kingston; D. W. Huo; Y. S. Lu; S. Chalk


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.