Utilizing the variability of resistive random access memory to implement reconfigurable physical unclonable functions

IEEE Electron Device Letters

Volumn 36, Issue 2, 2015, Pages 138-140

  Chen, An ^a  

^a GLOBALFOUNDIRES ^*  (United States)

Author keywords

PUF; RRAM; security; variability

Indexed keywords

ACCESS CONTROL; CRYPTOGRAPHY; HAMMING DISTANCE; HARDWARE SECURITY; STOCHASTIC SYSTEMS;

PHYSICAL UNCLONABLE FUNCTIONS; PHYSICAL UNCLONABLE FUNCTIONS (PUF); PUF; RESISTIVE RANDOM ACCESS MEMORY; RESISTIVE RANDOM ACCESS MEMORY (RRAM); RRAM; SECURITY; VARIABILITY;

RANDOM ACCESS STORAGE;

EID: 84921855863     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2014.2385870     Document Type: Article

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