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In Figure 3, PMMA was removed by thermal annealing for WT-graphene FETs while the annealing process was not performed for DT-graphene FETs, which indicates that PVA residues remained in DT-graphene FETs. Therefore, it can be inferred that PVA residues in DT-graphene do not affect hole mobility of graphene significantly because hole mobility of DT-graphene with PVA residues is higher than that of WT-graphene with minimized PMMA residues. The effect of PVA residues on the mobility of graphene is out of the scope of the present paper and is currently under investigation.
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