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Volumn 11, Issue 2, 2015, Pages 175-181

Metal-etching-free direct delamination and transfer of single-layer graphene with a high degree of freedom

Author keywords

[No Author keywords available]

Indexed keywords

DELAMINATION; ETCHING; GRAPHENE;

EID: 84920512518     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201401196     Document Type: Article
Times cited : (67)

References (33)
  • 2
    • 67649225738 scopus 로고    scopus 로고
    • A. K. Geim, Science 2009, 324, 1530.
    • (2009) Science , vol.324 , pp. 1530
    • Geim, A.K.1
  • 31
    • 84920546454 scopus 로고    scopus 로고
    • note
    • In Figure 3, PMMA was removed by thermal annealing for WT-graphene FETs while the annealing process was not performed for DT-graphene FETs, which indicates that PVA residues remained in DT-graphene FETs. Therefore, it can be inferred that PVA residues in DT-graphene do not affect hole mobility of graphene significantly because hole mobility of DT-graphene with PVA residues is higher than that of WT-graphene with minimized PMMA residues. The effect of PVA residues on the mobility of graphene is out of the scope of the present paper and is currently under investigation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.