SCOPUS 정보 검색 플랫폼

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Volumn , Issue , 2014, Pages 2060-2065

Real time spectroscopic ellipsometry analysis of the three-stages of CuIn1-xGaxSe2 co-evaporation

(8) Pradhan, Puja a Aryal, Puruswottam a Ibdah, Abdel Rahman a Aryal, Krishna b Li, Jian a Podraza, N J a Marsillac, S b Collins, R W a

a UNIVERSITY OF TOLEDO (United States)

b OLD DOMINION UNIVERSITY (United States)

Author keywords

CIGS; ellipsometry; photovoltaic cells; thickness measurement

Indexed keywords

COPPER COMPOUNDS; COPPER METALLOGRAPHY; DEPOSITION RATES; ELLIPSOMETRY; EVAPORATION; GALLIUM ALLOYS; GALLIUM COMPOUNDS; GRAIN GROWTH; INDIUM ALLOYS; INDIUM METALLOGRAPHY; LAYERED SEMICONDUCTORS; LIME; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; SELENIUM COMPOUNDS; SEMICONDUCTOR ALLOYS; SOLAR ABSORBERS; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

CIGS; COMPOSITIONAL INFORMATION; COPPER INDIUM GALLIUM DISELENIDE; DIELECTRIC FUNCTIONS; PHOTOVOLTAIC DEVICES; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; SOLAR CELL PERFORMANCE; SUBSTRATE TEMPERATURE;

IN SITU PROCESSING;

EID: 84912074562 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2014.6925332 Document Type: Conference Paper

Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.