Automatic inspection system of LED chip using two-stages back-propagation neural network

Journal of Intelligent Manufacturing

Volumn 25, Issue 6, 2014, Pages 1235-1243

  Kuo, Chung Feng Jeffrey ^a   Hsu, Chien Tung Max ^a   Liu, Zong Xian ^a   Wu, Han Cheng ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Automatic defect detection; Back propagation neural network; LED; Normalized correlation coefficient method

Indexed keywords

BACKPROPAGATION; CLUSTER ANALYSIS; DEFECTS; IMAGE ACQUISITION; IMAGE ENHANCEMENT; K-MEANS CLUSTERING; LIGHT EMITTING DIODES; TORSIONAL STRESS;

AUTOMATIC DEFECT DETECTIONS; AUTOMATIC INSPECTION SYSTEM; BACK PROPAGATION NEURAL NETWORKS; DEFECT CLASSIFICATION; DEFECT-DETECTION SYSTEMS; HISTOGRAM EQUALIZATIONS; K-MEANS CLUSTERING METHOD; NORMALIZED CORRELATION COEFFICIENT;

NEURAL NETWORKS;

EID: 84912032946     PISSN: 09565515     EISSN: 15728145     Source Type: Journal    
DOI: 10.1007/s10845-012-0725-7     Document Type: Article

References (24)

1. Balfour, C., Smith, J. S., & Amin-Nejad, S. (2004). Feature correlation for weld image-processing applications. International Journal of Production Research, 42(5), 975–995.
2. Chang, C. Y., Chang, C. H., Li, C. H. & Jeng, M. D., (2007). Learning vector quantization neural networks for LED wafer defect inspection. IEEE Digital Object Identifier, 230–230.
3. Chiu, H. J., & Cheng, S. J. (2007). LED backlight driving system for large-scale LCD panels. IEEE Transactions on Industrial Electronics, 54(5), 2751–2760.
4. Chiu, H. J., Lo, Y. K., Chen, J. T., Cheng, S. J., Lin, C. Y., & Mou, S. C. (2010). A high-efficiency dimmable LED driver for low-power lighting applications. IEEE Transactions on Industrial Electronics, 57(2), 735–743.
5. Chung, K. L., & Chen, W. Y. (2003). Fast adaptive PNN-based thresholding algorithms. Pattern Recognition, 36(12), 2793–2804.
6. Fu, X. Y., Liu, X. J. & Wu, Y., (2009). Research and analysis of the design development and perspective technology for LED lighting products. In IEEE 10th international conference on computer-aided industrial design & Conceptual Design, pp. 1330–1334.
7. Huang, R. T., Holm, P., & Wright, P. D. (1998). Design and fabrication of AlGaInP LED array with integrated GaAs decode circuit. IEEE Transactions on Electron Devices, 45(18), 2283–2290.
8. Huang, C. J., Wu, C. F., & Wang, C. C. (2002). Image processing techniques for Wafer defect cluster identification. IEEE Design & Test of Computers, 19(2), 44–48.
9. Jain, A. K., & Dubes, R. C. (1988). Algorithms for clustering data. New Jersey: Prentice Hall.
10. Kai, B., & Uwe, D. H. (2001). Template matching using fast normalized cross correlation. Proceedings of SPIE—The International Society for Optical Engineering, 4387, 95–102.
11. Keränen, K., Heikkinen, M., Hiltunen, M., Lahti, M., Mäkinen, J.T., Sunnari, A., Rekilä, J. & Rönkä K., (2010). Backlight illumination structure based on inorganic LED devices and laminated multilayer polymer substrate. In IEEE 3rd Electronic System—Integration Technology Conference (ESTC), pp. 1–4.
12. Ko, S. J., & Lee, Y. H. (1991). Center weighted median filters and their applications to image enhancement. IEEE Transactions On Circuits and Systems for Video Technology, 39(9), 984–993.
13. Liao, Y. Y. (2008). Apply machine vision technology to defect inspection of high brightness light emitting diode. National Taiwan University of Science and Technology.
14. Lin, H. D., & Jiang, J. D. (2007). Applying discrete cosine transform and grey relational analysis to surface defect detection of LEDs. Journal of the Chinese Institute of Industrial Engineers, 24(6), 458–467.
15. Liu, T., Wang, Y., Yang, F. B., & Yu, J. (2009). Designing of LED illuminating system and testing notice. IEEE International Conference on Information Engineering, 2, 277–280.
16. Lo, Y. K., Wu, K. H., Pai, K. J., & Chiu, H. J. (2009). Design and implementation of RGB LED drivers for LCD backlight modules. IEEE Transactions on Industrial Electronics, 56(12), 4862–4871.
17. Miyawaki, Y., Wang, D. X., Tanaka, O., Oyama, N. & Okuno, A., (2007). Unique transparent resin and vacuum printing encapsulation systems (VPES) packaging method for new white LED. In IEEE 6th international conference on polymers and adhesives in microelectronics and photonics, pp. 81–86.
18. Okuno, A., Miyawaki, Y., Oyama, N. & Wang, D. X., (2006). Unique white LED packaging systems. IEEE international conference on electronic materials and packaging, pp. 1–5.
19. Otsu, N. (1979). A threshold selection method from gray-level histograms. IEEE Transactions on System, Man and Cybernetics, 9(1), 62–66.
20. Tsai, D. M., & Lin, C. T. (2003). Fast normalized cross correlation for defect detection. Pattern Recognition Letters, 24, 2625–2631.
21. Ward, G. (2003). Fast robust image registration for compositing high dynamic range photographs from handheld exposure. Journal of Graphics Tools, 8(2), 17–30.
22. Windyge, P. S. (2001). Fast impulsive noise removal. IEEE Transactions on Image Processing, 10(1), 173–179.
23. Wu, B. L., Luo, X. B. & Liu, S., (2010). Effect mechanism of moisture diffusion on LED reliability. In IEEE 3rd electronic system-integration technology conference (ESTC), 1–5.
24. Ying, S. P., Tang, C. W. & Huang, B. J., (2006). Characterizing LEDs for mixture of colored LED light sources. In IEEE International Conference on Electronic Materials and Packaging, pp. 1–5.