Fast normalized cross correlation for defect detection

Pattern Recognition Letters

Volumn 24, Issue 15, 2003, Pages 2625-2631

  Tsai, Du Ming ^a   Lin, Chien Ta ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; Normalized cross correlation; Sum tables

Indexed keywords

COMPUTER VISION; IMAGE PROCESSING;

NORMALIZED CROSS CORRELATION (NCC);

PATTERN RECOGNITION;

DEFECT; PATTERN RECOGNITION;

EID: 0041328321     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(03)00106-5     Document Type: Article

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