메뉴 건너뛰기




Volumn 105, Issue 1, 2014, Pages

Strength, stiffness, and microstructure of Cu(In,Ga)Se2 thin films deposited via sputtering and co-evaporation

Author keywords

[No Author keywords available]

Indexed keywords

CO-EVAPORATIONS; CU(IN , GA)SE2;

EID: 84908519181     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4890086     Document Type: Article
Times cited : (37)

References (29)
  • 6
    • 84908543213 scopus 로고    scopus 로고
    • See supplementary material at http://dx.doi.org/10.1063/1.4890086 E-APPLAB-105-054428 for more information on experimental and fabrication details, for analysis of nanopillar compression, and for EDS and electrical measurements.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.