Mo effect on one-step sputtering chalcopyrite CIGS thin films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 1999-2002

  Lin, Tzu Ying ^a   Chen, Chia Hsiang ^a   Lai, Chih Huang ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Mo effect; residual stress

Indexed keywords

BACK CONTACT; CIGS FILMS; CIGS THIN FILMS; CRYSTALLINE STRUCTURE; CU(IN , GA)SE; DENSE STRUCTURES; PREFERRED ORIENTATIONS; SPUTTERING PROCESS; STRONG CORRELATION; WORKING PRESSURE EFFECT; WORKING PRESSURES;

COPPER COMPOUNDS; MOLYBDENUM; PRESSURE EFFECTS; RESIDUAL STRESSES; SEMICONDUCTING SELENIUM COMPOUNDS;

COPPER;

EID: 84869450573     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317989     Document Type: Conference Paper

References (6)

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