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Materials Science in Semiconductor Processing

Volumn 27, Issue , 2014, Pages 994-1006

Structural, optical and electrical studies on Mg-doped NiO thin films for sensitivity applications

(4) Ben Amor, M a Boukhachem, A a Boubaker, K a Amlouk, M a

a FACULTÉ DES SCIENCES DE TUNIS (Tunisia)

Author keywords

Dopant Mg; Nickel oxide (NiO); Spray pyrolysis; Thin films processing

Indexed keywords

ELECTRICAL STUDIES; MG-DOPING; NICKEL OXIDES (NIO); NIO THIN FILM;

SPRAY PYROLYSIS;

EID: 84908282756 PISSN: 13698001 EISSN: None Source Type: Journal
DOI: 10.1016/j.mssp.2014.08.008 Document Type: Article

Times cited : (74)

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