All-dielectric subwavelength metasurface focusing lens

Optics Express

Volumn 22, Issue 21, 2014, Pages 26212-26221

  West, Paul R ^a   Stewart, James L ^a   Kildishev, Alexander V ^a   Shalaev, Vladimir M ^a   Shkunov, Vladimir V ^b   Strohkendl, Friedrich ^b   Zakharenkov, Yuri A ^b   Dodds, Robert K ^b   Byren, Robert ^b  

^a PURDUE UNIVERSITY   (United States)

^b RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACTERIOLOGY; ETCHING; MICROLENSES;

DIELECTRIC SURFACE; FOCAL DISTANCES; GRADIENT-INDEX; PATTERNED ARRAYS; PHASE GRADIENT; PROOF OF CONCEPT; SUB-WAVELENGTH; VARIABLE DIAMETER;

METAMATERIALS;

COMPUTER AIDED DESIGN; DEVICES; EQUIPMENT DESIGN; MATERIALS; OPTICAL INSTRUMENTATION; REFRACTOMETRY; TERAHERTZ RADIATION;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; LENSES; MANUFACTURED MATERIALS; REFRACTOMETRY; TERAHERTZ RADIATION;

EID: 84908179581     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.026212     Document Type: Article

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