Design and fabrication of blazed binary diffractive elements with sampling periods smaller than the structural cutoff

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 5, 1999, Pages 1143-1156

  Lalanne, Philippe ^a   Astilean, Simion ^a   Chavel, Pierre ^a   Cambril, Edmond ^a   Launois, Huguette ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE OPTICS; ELECTROMAGNETIC FIELD THEORY; ETCHING; MATHEMATICAL MODELS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; TITANIUM DIOXIDE;

BINARY DIFFRACTIVE ELEMENTS; BLAZED-INDEX GRATINGS; ECHELETTE GRATINGS; LIGHT-SHADOWING EFFECT; STRUCTURAL CUTOFF;

DIFFRACTION GRATINGS;

EID: 0032606441     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.001143     Document Type: Article

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