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Volumn , Issue , 2009, Pages 148-149

Large-scale application of binary subwavelength structures

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE ELEMENT; LARGE-SCALE APPLICATIONS; SUB-WAVELENGTH STRUCTURES; WAVEFRONT ERRORS;

EID: 71849118442     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OMEMS.2009.5338618     Document Type: Conference Paper
Times cited : (5)

References (9)
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    • Kikuta, H.; Toyota, H. & Yu, W, Optical Review, Springer, 2003, 10, 63-73
  • 2
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    • Lalanne, P.; Astilean, S.; Chavel, P.; Cambril, E. & Launois, H, Opt. Lett., OSA, 1998, 23, 1081-1083
    • Lalanne, P.; Astilean, S.; Chavel, P.; Cambril, E. & Launois, H, Opt. Lett., OSA, 1998, 23, 1081-1083
  • 3
    • 84975635732 scopus 로고
    • Appl. Opt, OSA
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    • Farn, M., Appl. Opt, OSA, 1992, 31, 4453-4458
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    • Farn, M.1
  • 4
    • 0029306643 scopus 로고
    • Journal of the Optical Society of America A, OSA
    • Zhou, Z. & Drabik, T., Journal of the Optical Society of America A, OSA, 1995, 12, 1104-1112
    • (1995) , vol.1104-1112 , Issue.12
    • Zhou, Z.1    Drabik, T.2
  • 5
    • 35448992883 scopus 로고    scopus 로고
    • Oonishi, T.; Konishi, T. & Itoh, K., Appl. Opt., OSA, 2007, 46, 5019-5026
    • Oonishi, T.; Konishi, T. & Itoh, K., Appl. Opt., OSA, 2007, 46, 5019-5026
  • 6
    • 40149100320 scopus 로고    scopus 로고
    • Ribot, C.; Lalanne, P.; Lee, M.; Loiseaux, B. & Huignard, J, Journal of the Optical Society of America A, OSA, 2007, 24, 3819-3826
    • Ribot, C.; Lalanne, P.; Lee, M.; Loiseaux, B. & Huignard, J, Journal of the Optical Society of America A, OSA, 2007, 24, 3819-3826
  • 8
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    • Journal of the Optical Society of America A, OSA
    • Mait, J.; Prather, D. & Mirotznik, M., Journal of the Optical Society of America A, OSA, 1999, 16, 1157-1167
    • (1999) , vol.1157-1167 , Issue.16
    • Mait, J.1    Prather, D.2    Mirotznik, M.3
  • 9
    • 0001037185 scopus 로고    scopus 로고
    • Yu, W.; Takahara, K.; Konishi, T.; Yotsuya, T. & Ichioka, Y., Applied Optics, OSA, 2000, 39, 3531-3536
    • Yu, W.; Takahara, K.; Konishi, T.; Yotsuya, T. & Ichioka, Y., Applied Optics, OSA, 2000, 39, 3531-3536


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.