Challenges in compact modelling of future RF CMOS

European Solid-State Device Research Conference

Volumn 13-15 Sept. 1999, Issue , 1999, Pages 95-102

  Klaassen, D B M ^a   Van Langevelde, R ^a   Scholten, A J ^a   Tiemeijer, L F ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS PROCESS TECHNOLOGY; CMOS TECHNOLOGY; COMPACT MODELLING; RF APPLICATIONS; RF-CMOS; SUB-100 NM;

CMOS INTEGRATED CIRCUITS;

EID: 84907886623     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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