Statistical modeling and circuit simulation for design for manufacturing

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1998, Pages 763-766

  Smedes, T ^a   Emonts, P G A ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS; STATISTICAL PROCESS CONTROL;

DESIGN FOR MANUFACTURING (DFM);

INTEGRATED CIRCUIT LAYOUT;

EID: 0032257652     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)