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Volumn 14, Issue 10, 2014, Pages 5948-5952

Gate-induced carrier delocalization in quantum dot field effect transistors

Author keywords

cadmium selenide; delocalization; field effect transistor; magnetoresistance; mobility edge; Quantum dots

Indexed keywords

SEMICONDUCTOR QUANTUM DOTS;

EID: 84907881695     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl5029655     Document Type: Article
Times cited : (25)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.