A comparison of extraction techniques for threshold voltage mismatch

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2002, Pages 235-240

  Croon, J A ^a,b   Tuinhout, H P ^c   Difrenza, R ^d,e   Knol, J ^f   Moonen, A J ^f   Decoutere, S ^a   Maes, H E ^a,b   Sansen, W ^b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

^d STMICROELECTRONICS   (France)

^e Grenoble INP Phelma   (France)

^f NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; MATHEMATICAL MODELS; MOSFET DEVICES; THRESHOLD VOLTAGE; TRANSISTORS; VOLTAGE MEASUREMENT;

EXTRACTION ALGORITHM; THRESHOLD VOLTAGE MISMATCH;

MICROELECTRONIC PROCESSING;

EID: 0038495563     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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