Degradation of low frequency noise and DC characteristics on MOSFETs and its correlation with SILC

European Solid-State Device Research Conference

Volumn , Issue , 2003, Pages 283-286

  Bandiera, L ^a   Cester, A ^a   Cimino, S ^a   Gerardin, S ^a   Paccagnella, A ^a   Ghidini, G ^b  

^a UNIVERSITY OF PADOVA   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DC CHARACTERISTICS; LOW-FREQUENCY NOISE; MOSFETS;

EID: 84907705416     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256869     Document Type: Conference Paper

References (10)

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