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Volumn 454, Issue , 2014, Pages 189-196
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Determination and analysis of optical constants for Ge15Se 60Bi25 thin films
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Author keywords
Absorption edge; Accurate method; Approximate methods; Dielectric constants; Optical constants; Relative errors
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Indexed keywords
AMORPHOUS FILMS;
APPROXIMATION THEORY;
ERRORS;
OPTICAL CONSTANTS;
OPTICAL VARIABLES CONTROL;
PERMITTIVITY;
REFRACTIVE INDEX;
SUBSTRATES;
THIN FILMS;
ABSORPTION EDGES;
ACCURATE METHOD;
APPROXIMATE METHODS;
COMPLEX DIELECTRIC CONSTANT;
RELATIVE ERRORS;
SURFACE ENERGY LOSS FUNCTION;
THERMAL EVAPORATION TECHNIQUE;
TRANSMITTANCE AND REFLECTANCES;
SEMICONDUCTING SELENIUM COMPOUNDS;
PERMITTIVITY;
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EID: 84906814920
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2014.07.068 Document Type: Article |
Times cited : (46)
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References (41)
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