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Journal of Materials Science: Materials in Electronics

Volumn 12, Issue 7, 2001, Pages 395-401

Annealing effects on the structural and optical characteristics of electron beam deposited Ge-Se-Bi thin films

(2) El Shazly, O a Hafiz, M M a

a UNITED ARAB EMIRATES UNIVERSITY (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ANNEALING; CHEMICAL BONDS; ELECTRON ABSORPTION; ENERGY GAP; X RAY DIFFRACTION ANALYSIS;

ROOM TEMPERATURE;

THIN FILMS;

EID: 0035388820 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: 10.1023/A:1011234731794 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.