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Volumn 129, Issue , 2014, Pages 70-81

In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy

Author keywords

Defects; Fourier transform photocurrent spectroscopy (FTPS); Hydrogenated amorphous silicon (a Si:H); In situ annealing; In situ light soaking; Staebler Wronski effect (SWE)

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS SILICON; ANNEALING; DEFECTS; HYDROGENATION; SOLAR CELLS;

EID: 84906324619     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2014.03.022     Document Type: Article
Times cited : (25)

References (41)
  • 1
    • 21544455021 scopus 로고
    • Reversible conductivity changes in discharge-produced amorphous Si
    • D.L. Staebler, and C.R. Wronski Reversible conductivity changes in discharge-produced amorphous Si Appl. Phys. Lett. 31 4 1977 292 294
    • (1977) Appl. Phys. Lett. , vol.31 , Issue.4 , pp. 292-294
    • Staebler, D.L.1    Wronski, C.R.2
  • 2
    • 0019026937 scopus 로고
    • Optically induced conductivity changes in discharge-produced hydrogenated amorphous silicon
    • DOI 10.1063/1.328084
    • D.L. Staebler, and C.R. Wronski Optically induced conductivity changes in discharge-produced hydrogenated amorphous silicon J. Appl. Phys. 51 6 1980 3262 3268 (Pubitemid 11441235)
    • (1980) Journal of Applied Physics , vol.51 , Issue.6 , pp. 3262-3268
    • Staebler, D.L.1    Wronski, C.R.2
  • 3
    • 0003610598 scopus 로고
    • Photoconductivity, trapping, and recombination in discharge-produced, hydrogenated amorphous silicon
    • C.R. Wronski, and R.E. Daniel Photoconductivity, trapping, and recombination in discharge-produced, hydrogenated amorphous silicon Phys. Rev. B 23 2 1981 794 804
    • (1981) Phys. Rev. B , vol.23 , Issue.2 , pp. 794-804
    • Wronski, C.R.1    Daniel, R.E.2
  • 4
    • 0000496433 scopus 로고
    • Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopy
    • W.B. Jackson, and N.M. Amer Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopy Phys. Rev. B 25 8 1982 5559 5562
    • (1982) Phys. Rev. B , vol.25 , Issue.8 , pp. 5559-5562
    • Jackson, W.B.1    Amer, N.M.2
  • 5
    • 0000813937 scopus 로고
    • Transient photocapacitance and photocurrent studies of undoped hydrogenated amorphous silicon
    • A.V. Gelatos, K.K. Mahavadi, J.D. Cohen, and J.P. Harbison Transient photocapacitance and photocurrent studies of undoped hydrogenated amorphous silicon Appl. Phys. Lett. 53 5 1988 403 405
    • (1988) Appl. Phys. Lett. , vol.53 , Issue.5 , pp. 403-405
    • Gelatos, A.V.1    Mahavadi, K.K.2    Cohen, J.D.3    Harbison, J.P.4
  • 6
    • 0026415510 scopus 로고
    • How to reach more precise interpretation of subgap absorption spectra in terms of deep defect density in a-Si:H
    • N. Wyrsch, F. Finger, T.J. McMahon, and M. Vaněček How to reach more precise interpretation of subgap absorption spectra in terms of deep defect density in a-Si:H J. Non-Cryst. Solids 137-138 1991 347 350
    • (1991) J. Non-Cryst. Solids , vol.137-138 , pp. 347-350
    • Wyrsch, N.1    Finger, F.2    McMahon, T.J.3    Vaněček, M.4
  • 7
    • 0000407880 scopus 로고
    • Photo-induced creation of metastable defects in a-Si:H at low temperatures and their effect on the photoconductivity
    • P. Stradins, and H. Fritzsche Photo-induced creation of metastable defects in a-Si:H at low temperatures and their effect on the photoconductivity Philos. Mag. B 69 1 1994 121 139
    • (1994) Philos. Mag. B , vol.69 , Issue.1 , pp. 121-139
    • Stradins, P.1    Fritzsche, H.2
  • 8
    • 0000743909 scopus 로고
    • Charged defect states in intrinsic hydrogenated amorphous silicon films
    • M. Güneş, C.R. Wronski, and T.J. McMahon Charged defect states in intrinsic hydrogenated amorphous silicon films J. Appl. Phys. 76 4 1994 2260 2263
    • (1994) J. Appl. Phys. , vol.76 , Issue.4 , pp. 2260-2263
    • Güneş, M.1    Wronski, C.R.2    McMahon, T.J.3
  • 9
    • 0032064992 scopus 로고    scopus 로고
    • Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: Implications for defect models
    • PII S002230939800074X
    • J.D. Cohen, and D. Kwon Identification of the dominant electron deep trap in amorphous silicon from ESR and modulated photocurrent measurements: implications for defect models J. Non-Cryst. Solids 227-230 1998 348 352 (Pubitemid 128427137)
    • (1998) Journal of Non-Crystalline Solids , vol.227-230 , Issue.PART 1 , pp. 348-352
    • Cohen, J.D.1    Kwon, D.2
  • 10
    • 33747383070 scopus 로고    scopus 로고
    • Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane
    • DOI 10.1016/j.tsf.2005.12.133, PII S0040609005023953
    • G. van Elzakker, V. Nádaždy, F.D. Tichelaar, J.W. Metselaar, and M. Zeman Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane Thin Solid Films 511-512 2006 252 257 (Pubitemid 44250864)
    • (2006) Thin Solid Films , vol.511-512 , pp. 252-257
    • Van Elzakker, G.1    Nadazdy, V.2    Tichelaar, F.D.3    Metselaar, J.W.4    Zeman, M.5
  • 11
    • 45849108394 scopus 로고    scopus 로고
    • Analysis of hydrogenated amorphous silicon thin films and solar cells by means of Fourier transform photocurrent spectroscopy
    • J. Melskens, G. van Elzakker, Y. Li, and M. Zeman Analysis of hydrogenated amorphous silicon thin films and solar cells by means of Fourier transform photocurrent spectroscopy Thin Solid Films 516 20 2008 6877 6881
    • (2008) Thin Solid Films , vol.516 , Issue.20 , pp. 6877-6881
    • Melskens, J.1    Van Elzakker, G.2    Li, Y.3    Zeman, M.4
  • 12
    • 0019608821 scopus 로고
    • Direct measurement of the gap states and band tail absorption by constant photocurrent method in amorphous silicon
    • DOI 10.1016/0038-1098(81)91113-3
    • M. Vaněček, J. Kočka, J. Stuchlík, and A. Tříska Direct measurement of the gap states and band tail absorption by constant photocurrent method in amorphous silicon Solid State Commun. 39 11 1981 1199 1202 (Pubitemid 12439472)
    • (1981) Solid State Communications , vol.39 , Issue.11 , pp. 1199-1202
    • Vanecek, M.1    Kocka, J.2    Stuchlik, J.3    Triska, A.4
  • 13
    • 0020302124 scopus 로고
    • Recombination centers in phosphorus doped hydrogenated amorphous silicon
    • DOI 10.1016/0038-1098(82)90023-0
    • C.R. Wronski, B. Abeles, T. Tiedje, and C.D. Cody Recombination centers in phosphorus doped hydrogenated amorphous silicon Solid State Commun. 44 10 1982 1423 1426 (Pubitemid 13487060)
    • (1982) Solid State Communications , vol.44 , Issue.10 , pp. 1423-1426
    • Wronski, C.R.1    Abeles, B.2    Tiedje, T.3    Cody, G.D.4
  • 14
    • 79956000735 scopus 로고    scopus 로고
    • Fourier-transform photocurrent spectroscopy of microcrystalline silicon for solar cells
    • M. Vaněček, and A. Poruba Fourier-transform photocurrent spectroscopy of microcrystalline silicon for solar cells Appl. Phys. Lett. 80 5 2002 719 721
    • (2002) Appl. Phys. Lett. , vol.80 , Issue.5 , pp. 719-721
    • Vaněček, M.1    Poruba, A.2
  • 15
    • 84859178173 scopus 로고    scopus 로고
    • G. Nikolić, InTech.
    • J. Holovský Fourier Transforms - New Analytical approaches and FTIR strategies G. Nikolić, 2011 InTech. 257 282 (available from: http://www.intechopen.com/books/fourier-transforms-new-analytical-approaches- and-ftir-strategies/fourier-transform-photocurrent-spectroscopy-on-non- crystalline-semiconductors)
    • (2011) Fourier Transforms - New Analytical Approaches and FTIR Strategies , pp. 257-282
    • Holovský, J.1
  • 16
    • 84875124996 scopus 로고    scopus 로고
    • Optical model for multilayer structures with coherent, partly coherent and incoherent layers
    • R. Santbergen, A.H.M. Smets, and M. Zeman Optical model for multilayer structures with coherent, partly coherent and incoherent layers Opt. Express 21 S2 2013 A262 A267
    • (2013) Opt. Express , vol.21 , Issue.S2
    • Santbergen, R.1    Smets, A.H.M.2    Zeman, M.3
  • 17
    • 10844264417 scopus 로고    scopus 로고
    • Degradation studies of transparent conducting oxide: A substrate for microcrystalline silicon thin film solar cells
    • R. Das, T. Jana, and S. Ray Degradation studies of transparent conducting oxide: a substrate for microcrystalline silicon thin film solar cells Sol. Energy Mater. Sol. Cells 86 2005 207 216
    • (2005) Sol. Energy Mater. Sol. Cells , vol.86 , pp. 207-216
    • Das, R.1    Jana, T.2    Ray, S.3
  • 18
    • 36148962857 scopus 로고    scopus 로고
    • Transparent conducting oxide films for thin film silicon photovoltaics
    • DOI 10.1016/j.tsf.2007.08.110, PII S004060900701512X
    • W. Beyer, J. Hüpkes, and H. Stiebig Transparent conducting oxide films for thin film silicon photovoltaics Thin Solid Films 516 2-4 2007 147 154 (Pubitemid 350110588)
    • (2007) Thin Solid Films , vol.516 , Issue.2-4 , pp. 147-154
    • Beyer, W.1    Hupkes, J.2    Stiebig, H.3
  • 20
    • 84860524724 scopus 로고    scopus 로고
    • A scattering model for nano-textured interfaces and its application in opto-electrical simulations of thin-film silicon solar cells
    • K. Jäger, M. Fischer, R.A.C.M.M. van Swaaij, and M. Zeman A scattering model for nano-textured interfaces and its application in opto-electrical simulations of thin-film silicon solar cells J. Appl. Phys. 111 2012 083108
    • (2012) J. Appl. Phys. , vol.111 , pp. 083108
    • Jäger, K.1    Fischer, M.2    Van Swaaij, R.A.C.M.M.3    Zeman, M.4
  • 22
    • 0022693611 scopus 로고
    • Suppression of interference fringes in absorption measurements on thin films
    • DOI 10.1016/0030-4018(86)90270-1
    • D. Ritter, and K. Weiser Suppression of interference fringes in absorption measurements on thin films Opt Commun. 57 5 1986 336 338 (Pubitemid 16531995)
    • (1986) Optics Communications , vol.57 , Issue.5 , pp. 336-338
    • Ritter, D.1    Weiser, K.2
  • 23
    • 0003972070 scopus 로고    scopus 로고
    • 7th ed. Cambridge University Press 54-74
    • M. Born, and E. Wolf Principles of Optics 7th ed. 1999 Cambridge University Press 54-74
    • (1999) Principles of Optics
    • Born, M.1    Wolf, E.2
  • 24
    • 84871775899 scopus 로고    scopus 로고
    • New insights in the nanostructure and defect states of hydrogenated amorphous silicon obtained by annealing
    • J. Melskens, A.H.M. Smets, M. Schouten, S.W.H. Eijt, H. Schut, and M. Zeman New insights in the nanostructure and defect states of hydrogenated amorphous silicon obtained by annealing IEEE J. Photovolt. 3 1 2013 65 71
    • (2013) IEEE J. Photovolt. , vol.3 , Issue.1 , pp. 65-71
    • Melskens, J.1    Smets, A.H.M.2    Schouten, M.3    Eijt, S.W.H.4    Schut, H.5    Zeman, M.6
  • 25
    • 0019080971 scopus 로고
    • Characterisation of glow-discharge deposited a-Si:H
    • H. Fritzsche Characterisation of glow-discharge deposited a-Si:H Sol. Energy Mater. 3 1980 447 501
    • (1980) Sol. Energy Mater. , vol.3 , pp. 447-501
    • Fritzsche, H.1
  • 26
    • 0039947751 scopus 로고
    • Thickness dependence of the photoconductivity of phosphorus-doped hydrogenated amorphous silicon
    • I. Solomon, and M.H. Brodsky Thickness dependence of the photoconductivity of phosphorus-doped hydrogenated amorphous silicon J. Appl. Phys. 51 1980 4548 4549
    • (1980) J. Appl. Phys. , vol.51 , pp. 4548-4549
    • Solomon, I.1    Brodsky, M.H.2
  • 28
    • 12744277181 scopus 로고
    • Method for the reduction of photothermal deflection spectroscopy data taken on amorphous silicon (a-Si:H)
    • S. Wiedeman, M.S. Bennett, and J.L. Newton Method for the reduction of photothermal deflection spectroscopy data taken on amorphous silicon (a-Si:H) Mater. Res. Soc. Symp. Proc. 95 1987 145 150
    • (1987) Mater. Res. Soc. Symp. Proc. , vol.95 , pp. 145-150
    • Wiedeman, S.1    Bennett, M.S.2    Newton, J.L.3
  • 29
    • 78650155672 scopus 로고    scopus 로고
    • Nature and evolution of light induced defects in hydrogenated amorphous silicon
    • Pennsylvania State University, State College PA, USA
    • X. Niu Nature and evolution of light induced defects in hydrogenated amorphous silicon Ph.D. thesis 2006 Pennsylvania State University, State College PA, USA
    • (2006) Ph.D. Thesis
    • Niu, X.1
  • 30
    • 62949169368 scopus 로고    scopus 로고
    • Characterisation of gap defect states in hydrogenated amorphous silicon materials
    • (A04-05-01-A04-05-06)
    • L. Jiao, and C.R. Wronski Characterisation of gap defect states in hydrogenated amorphous silicon materials Mater. Res. Soc. Symp. Proc. 1066 2008 (A04-05-01-A04-05-06)
    • (2008) Mater. Res. Soc. Symp. Proc. , vol.1066
    • Jiao, L.1    Wronski, C.R.2
  • 31
    • 78650395481 scopus 로고    scopus 로고
    • The Staebler-Wronski effect: New physical approaches and insights as a route to reveal its origin
    • (A14-02-01-A14-02-06)
    • A.H.M. Smets, C.R. Wronski, M. Zeman, and M.C.M. van de Sanden The Staebler-Wronski effect: new physical approaches and insights as a route to reveal its origin Mater. Res. Soc. Symp. Proc. 1245 2010 (A14-02-01-A14-02-06)
    • (2010) Mater. Res. Soc. Symp. Proc. , vol.1245
    • Smets, A.H.M.1    Wronski, C.R.2    Zeman, M.3    Van De Sanden, M.C.M.4
  • 33
    • 33750858128 scopus 로고    scopus 로고
    • Numerical differentiation from a viewpoint of regularization theory
    • DOI 10.1090/S0025-5718-06-01857-6, PII S0025571806018576
    • S. Lu, and S.V. Pereverzev Numerical differentiation from a viewpoint of regularization theory Math. Comput. 75 256 2006 1853 1870 (Pubitemid 44719734)
    • (2006) Mathematics of Computation , vol.75 , Issue.256 , pp. 1853-1870
    • Lu, S.1    Pereverzev, S.V.2
  • 34
    • 0043155224 scopus 로고
    • Measured and calculated distributions of deep defect states in hydrogenated amorphous silicon: Verification of deep defect relaxation dynamics
    • F. Zhang, and J.D. Cohen Measured and calculated distributions of deep defect states in hydrogenated amorphous silicon: verification of deep defect relaxation dynamics Phys. Rev. Lett. 71 4 1993 597 600
    • (1993) Phys. Rev. Lett. , vol.71 , Issue.4 , pp. 597-600
    • Zhang, F.1    Cohen, J.D.2
  • 35
    • 42749106751 scopus 로고    scopus 로고
    • Origin of charged gap states in a-Si:H and their evolution during light soaking
    • V. Nádaždy, and M. Zeman Origin of charged gap states in a-Si:H and their evolution during light soaking Phys. Rev. B 69 16 2004 165213
    • (2004) Phys. Rev. B , vol.69 , Issue.16 , pp. 165213
    • Nádaždy, V.1    Zeman, M.2
  • 37
    • 0035180132 scopus 로고    scopus 로고
    • Development in understanding and controlling the Staebler-Wronski effect in a-Si:H
    • DOI 10.1146/annurev.matsci.31.1.47
    • H. Fritzsche Development in understanding and controlling the Staebler-Wronski effect in a-Si:H Annu. Rev. Mater. Res. 31 2001 47 79 (and references therein) (Pubitemid 33080522)
    • (2001) Annual Review of Materials Science , vol.31 , pp. 47-79
    • Fritzsche, H.1
  • 38
    • 4344668571 scopus 로고    scopus 로고
    • Staebler-Wronski effect in hydrogenated amorphous silicon and related alloy films
    • (and references therein)
    • T. Shimizu Staebler-Wronski effect in hydrogenated amorphous silicon and related alloy films Jpn. J. Appl. Phys. 43 6A 2004 3257 3268 (and references therein)
    • (2004) Jpn. J. Appl. Phys. , vol.43 , Issue.6 A , pp. 3257-3268
    • Shimizu, T.1
  • 39
    • 4243798052 scopus 로고
    • Light-induced metastable defects in hydrogenated amorphous silicon: A systematic study
    • M. Stutzmann, W.B. Jackson, and C.C. Tsai Light-induced metastable defects in hydrogenated amorphous silicon: a systematic study Phys. Rev. B 32 1 1985 23 47
    • (1985) Phys. Rev. B , vol.32 , Issue.1 , pp. 23-47
    • Stutzmann, M.1    Jackson, W.B.2    Tsai, C.C.3
  • 40
    • 41749090882 scopus 로고    scopus 로고
    • Evolution of metastable defects in intrinsic layers of A-Si:H solar cells and corresponding thin film materials characterized by carrier recombination through midgap states
    • DOI 10.1109/WCPEC.2006.279786, 4059952, Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
    • B. Ross, J. Deng, M.L. Albert, R.W. Collins, C.R. Wronski, Evolution of metastable defects in intrinsic layers of a-Si:H solar cells and corresponding thin film materials characterized by carrier recombination through midgap states, in: Proceedings of the Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, vol. 2, Waikoloa, Hawaii, USA, 2006, pp. 1576-1579. (Pubitemid 351485309)
    • (2007) Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 , vol.2 , pp. 1576-1579
    • Ross, B.1    Deng, J.2    Albert, M.L.3    Collins, R.W.4    Wronski, C.R.5
  • 41
    • 33745224794 scopus 로고
    • Kinetic studies of the annealing behavior of a-Si:H p-i-n solar cells
    • (and references therein)
    • M.S. Bennett, J.L. Newton, and K. Rajan Kinetic studies of the annealing behavior of a-Si:H p-i-n solar cells J. Appl. Phys. 62 9 1987 3968 3975 (and references therein)
    • (1987) J. Appl. Phys. , vol.62 , Issue.9 , pp. 3968-3975
    • Bennett, M.S.1    Newton, J.L.2    Rajan, K.3


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