Analysis of hydrogenated amorphous silicon thin films and solar cells by means of Fourier Transform Photocurrent Spectroscopy

Thin Solid Films

Volumn 516, Issue 20, 2008, Pages 6877-6881

  Melskens, J ^a   van Elzakker, G ^a   Li, Y ^a   Zeman, M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Fourier Transform Photocurrent Spectroscopy (FTPS); Hydrogenated amorphous silicon (a Si:H); Hydrogenated microcrystalline silicon ( c Si:H); Photo induced degradation; Protocrystalline silicon; Thin film silicon solar cell

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; AMORPHOUS SILICON; CELLS; DIRECT ENERGY CONVERSION; FARM BUILDINGS; FOURIER TRANSFORMS; HYDROGEN; METALLIC FILMS; NONMETALS; PASSIVATION; PHOTOCURRENTS; PHOTOVOLTAIC CELLS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PRESSURE; QUALITY CONTROL; SEMICONDUCTING CADMIUM TELLURIDE; SILANES; SILICON; SOLAR ABSORBERS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SOLAR POWER GENERATION; SPECTRUM ANALYSIS; SULFATE MINERALS; THICK FILMS; THIN FILMS; VAPOR DEPOSITION;

(PL) PROPERTIES; ABSORBER LAYERS; DEFECT CONCENTRATIONS; DEPOSITION PRESSURES; ELSEVIER (CO); FLOW RATIOS; FOURIER TRANSFORM PHOTOCURRENT SPECTROSCOPY (FTPS); H FILMS; HIGHLY EFFICIENT; HYDROGENATED AMORPHOUS SILICON THIN FILMS; INDIVIDUAL (PSS 544-7); LIGHT SOAKING; RF PECVD; SUB BAND (SB); TANDEM CELLS; THIN FILM SILICON; THRESHOLD PRESSURES; TOP CELL; TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31);

AMORPHOUS FILMS;

EID: 45849108394     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.049     Document Type: Article

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