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Volumn 53, Issue 34, 2014, Pages 8908-8912

Direct observation of atomic dynamics and silicon doping at a topological defect in graphene

Author keywords

density functional calculations; doping; electron microscopy; graphene; silicon

Indexed keywords

ATOMS; DEFECTS; DENSITY FUNCTIONAL THEORY; DIMERS; DOPING (ADDITIVES); ELECTRON MICROSCOPY; GRAPHENE; TOPOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84906057746     PISSN: 14337851     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.201403382     Document Type: Article
Times cited : (63)

References (41)
  • 11
    • 84880278573 scopus 로고    scopus 로고
    • V. Berry, Carbon 2013, 62, 1-10
    • (2013) Carbon , vol.62 , pp. 1-10
    • Berry, V.1
  • 19
    • 84890685963 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2013, 52, 14237-14241
    • (2013) Angew. Chem. Int. Ed. , vol.52 , pp. 14237-14241


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.