Demonstration of subtraction imaging in confocal microscopy with vector beams

Optics Letters

Volumn 39, Issue 15, 2014, Pages 4529-4532

  Segawa, Susumu ^a   Kozawa, Yuichi ^a   Sato, Shunichi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

POLARIZATION;

AZIMUTHAL POLARIZATION; AZIMUTHALLY POLARIZED BEAMS; ELECTRIC COMPONENTS; LATERAL RESOLUTION; RADIALLY POLARIZED BEAM; SUBTRACTION IMAGING; TIGHT FOCUSING; VECTOR BEAMS;

CONFOCAL MICROSCOPY;

EID: 84904960534     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.39.004529     Document Type: Article

References (13)

1. E. Ritteweger, K. Y. Han, S. E. Irvine, C. Eggeling, and S. W. Hell, Nat. Photonics 3, 144 (2009).
2. R. Heintzmann, Micron 34, 283 (2003).
3. K. Fujita, M. Kobayashi, S. Kawano, M. Yamanaka, and S. Kawata, Phys. Rev. Lett. 99, 228105 (2007).
4. O. Haeberlé and B. Simon, Opt. Commun. 282, 3657 (2009).
5. T. Wilson and C. Sheppard, Theory and Practice of Scanning Optical Microscopy (Academic, 1984).
6. S. J. Hewlett and T. Wilson, Mach. Vision Applic. 4, 233 (1991).
7. E. Sánchez-Ortiga, C. J. R. Sheppard, G. Saavedra, M. Martínez-Corral, A. Doblas, and A. Calatayud, Opt. Lett. 37, 1280 (2012).
8. C. Kuang, S. Li, W. Liu, X. Hao, Z. Gu, Y. Wang, J. Ge, H. Li, and X. Liu, Sci. Rep. 3, 1441 (2013).
9. H. Dehez, M. Piché, and Y. D. Konick, Opt. Express 21, 15912 (2013).
10. S. Segawa, Y. Kozawa, and S. Sato, Opt. Lett. 39, 3118 (2014).
11. S. Quabis, R. Dorn, M. Eberler, O. Glöckl, and G. Leuchs, Opt. Commun. 179, 1 (2000).
12. K. S. Youngworth and T. G. Brown, Opt. Express 7, 77 (2000).
13. Y. Kozawa, T. Hibi, A. Sato, H. Horanai, M. Kurihara, N. Hashimoto, H. Yokoyama, T. Nemoto, and S. Sato, Opt. Express 19, 15947 (2011).