Characterization of dilute magnetic semiconducting transition metal doped ZnO thin films by sol-gel spin coating method

Applied Surface Science

Volumn 313, Issue , 2014, Pages 870-876

  Vijayaprasath, G ^a   Murugan, R ^a   Ravi, G ^a   Mahalingam, T ^b   Hayakawa, Y ^c  

^a ALAGAPPA UNIVERSITY   (India)

^b Ajou University   (South Korea)

^c SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Defects; Ferromagnetism; Luminescence; Transition metal

Indexed keywords

COBALT COMPOUNDS; DEFECTS; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; FERROMAGNETISM; GRAIN BOUNDARIES; II-VI SEMICONDUCTORS; INFRARED DEVICES; LUMINESCENCE; MAGNETIC SEMICONDUCTORS; MANGANESE COMPOUNDS; METALLIC FILMS; NICKEL COMPOUNDS; OPTICAL FILMS; OXIDE FILMS; OXYGEN; OXYGEN VACANCIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; SURFACE MORPHOLOGY; TRANSITION METALS; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION; ZINC COATINGS; ZINC OXIDE; ZINC SULFIDE;

ELECTRONIC TRANSITION; ENERGY DISPERSIVE X-RAY ANALYSIS (EDX); HEXAGONAL WURTZITE STRUCTURE; SEMICONDUCTING TRANSITION; SOL-GEL SPIN COATING METHOD; STOICHIOMETRIC COMPOSITIONS; TRANSMITTANCE SPECTRA; X-RAY DIFFRACTION STUDIES;

THIN FILMS;

EID: 84904786210     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.06.093     Document Type: Article

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