Structural, magnetic and transport properties of Ni-doped ZnO films

Journal of Magnetism and Magnetic Materials

Volumn 323, Issue 6, 2011, Pages 829-832

  Lu, J J ^a   Lin, T C ^a   Tsai, S Y ^b   Mo, T S ^a   Gan, K J ^c  

^a KUN SHAN UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c NATIONAL CHIAYI UNIVERSITY   (Taiwan)

Author keywords

Diluted magnetic semiconductor; EXAFS; Ferromagnetism

Indexed keywords

DILUTED MAGNETIC SEMICONDUCTORS; ELECTRICAL RESISTANCE MEASUREMENT; ELECTRICAL RESISTANCES; EXAFS; HOST MATRICES; MAGNETIC AND TRANSPORT PROPERTIES; MAGNETIC MEASUREMENTS; NI ATOMS; NI-DOPED; NI-DOPING; ROOM TEMPERATURE; ROOM-TEMPERATURE FERROMAGNETISM; SECONDARY PHASE; SEMICONDUCTING BEHAVIOR; TEMPERATURE DEPENDENCE; WURTZITE STRUCTURE; XRD; ZNO;

ABSORPTION SPECTROSCOPY; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; MAGNETIC SEMICONDUCTORS; MAGNETIC VARIABLES MEASUREMENT; METALLIC FILMS; SATURATION MAGNETIZATION; SEMICONDUCTING FILMS; TRANSPORT PROPERTIES; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

FERROMAGNETISM;

EID: 78650518473     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2010.11.025     Document Type: Article

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