Optical identification of MoS2/graphene heterostructure on SiO2/Si substrate

Optics Express

Volumn 22, Issue 13, 2014, Pages 15969-15974

  Xu, Haiteng ^a   He, Dawei ^a   Fu, Ming ^a   Wang, Wenshuo ^a   Wu, Hongpeng ^a   Wang, Yongsheng ^a  

^a BEIJING JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GRAPHENE; SILICON; VAN DER WAALS FORCES;

CHEMICAL VAPOR DEPOSITION METHODS; FRESNEL; INCIDENT LIGHT; LAYER NUMBER; MEASURED VALUES; OPTICAL IDENTIFICATION; VAN DER WAALS;

MOLYBDENUM COMPOUNDS;

EID: 84903743694     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.015969     Document Type: Article

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