SCOPUS 정보 검색 플랫폼

Solid State Ionics

Volumn 262, Issue , 2014, Pages 883-888

Examining the crossing of I-V curves in devices based on mixed-ionic-electronic-conductors

(2) Kalaev, Dima a Riess, Ilan a

a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

Author keywords

Hysteresis; I V curve crossing; Memristive devices; Mixed ionic electronic conductors

Indexed keywords

HYSTERESIS;

APPLIED VOLTAGES; CONDUCTION ELECTRONS; I - V CURVE; IONIC DEFECTS; MEMRISTIVE DEVICES; MIXED-IONIC-ELECTRONIC-CONDUCTORS; NON-STOICHIOMETRIC MATERIALS; SIGNAL FREQUENCIES;

MEMRISTORS;

EID: 84903273386 PISSN: 01672738 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssi.2013.11.006 Document Type: Article

Times cited : (12)

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