Models and statistical analysis for accelerated degradation test

Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology

Volumn 40, Issue 12, 2008, Pages 2088-2090

  Zhao, Jian Yin ^a   Liu, Fang ^a  

^a NAVAL AERONAUTICAL AND ASTRONAUTICAL UNIVERSITY   (China)

Author keywords

Accelerated test; Degradation failure; Metallized film pulse capacitor; Reliability

Indexed keywords

CAPACITANCE; CAPACITORS; DEGRADATION; DIELECTRIC DEVICES; DISTRIBUTION FUNCTIONS; FAILURE ANALYSIS; METALLIZING; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; QUALITY ASSURANCE; RELIABILITY ANALYSIS; TESTING;

ACCELERATED DEGRADATION TESTS; ACCELERATED DEGRADATIONS; ACCELERATED TEST; BASIC IDEAS; CUMULATIVE DISTRIBUTION FUNCTIONS; DEGRADATION FAILURE; DEGRADATION FAILURE MODELS; DEGRADATION MODELS; FAILURE PROBABILITIES; IS COSTS; METALLIZED FILM PULSE CAPACITOR; RELIABILITY ASSESSMENTS; RELIABILITY MODELS; STATISTICAL ANALYSIS; UNKNOWN PARAMETERS;

RELIABILITY;

EID: 59649110390     PISSN: 03676234     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. NELSON W. Accelerated testing: Statistical models, test plans, and data analysis [M]. New York: John Wiley & Sons, 1990.
2. MEEKER W Q, Escobar L A. Statistical methods for reliability data [M]. New York: John Wiley & Sons, 1998.
3. NELSON W. Analysis of performance degradation data from accelerated tests [J]. IEEE Trans. On Rel., 1981, 30 (2): 149-155.
4. WANG W D, DAN D D. Reliability quantification of induction motors-accelerated degradation testing approach [C] //Proceedings Annual Reliability and Maintainability Symposium, [s. l.]: 2002, 325-331.