PIXE, SR-XRD and EXAFS analysis of Cu-doped ZnO films

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 332, Issue , 2014, Pages 126-129

  Zhang, B ^a   Yang, C ^b   Wang, J Z ^b   Shi, L Q ^a   Cheng, H S ^b  

^a INSTITUTE OF MODERN PHYSICS   (China)

^b FUDAN UNIVERSITY   (China)

Author keywords

Cu substitution; EXAFS; PIXE; ZnO based DMS

Indexed keywords

MAGNETRON SPUTTERING; METALLIC FILMS; SAPPHIRE; ZINC OXIDE; ZINC SULFIDE;

CU SUBSTITUTIONS; EXAFS; EXAFS ANALYSIS; MAGNETIC IMPURITY; PIXE; RF-MAGNETRON SPUTTERING; SAPPHIRE SUBSTRATES; ZNO-BASED DMS;

COPPER;

EID: 84902546810     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2014.02.044     Document Type: Article

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