PIXE analysis of Fe content in Fe-implanted GaN film

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 252, Issue 2, 2006, Pages 225-229

  Zhang, B ^a   Shi, L Q ^a   Chen, C C ^b   Zhao, D G ^c  

^a FUDAN UNIVERSITY   (China)

^b NANJING TECH UNIVERSITY   (China)

^c INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Diluted magnetic semiconductor; Fe content; Ion implantation; PIXE

Indexed keywords

FERROMAGNETISM; HYSTERESIS; ION IMPLANTATION; IRON; MAGNETIC SEMICONDUCTORS; SQUIDS;

DILUTED MAGNETIC SEMICONDUCTOR; FE CONTENT; PIXE;

THIN FILMS;

EID: 33751071888     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.09.007     Document Type: Article

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