Thin film substrates from the Raman spectroscopy point of view

Journal of Raman Spectroscopy

Volumn 45, Issue 6, 2014, Pages 465-469

  Gasparov, L ^a   Jegorel, T ^a,b   Loetgering, L ^a,c   Middey, S ^d   Chakhalian, J ^d  

^a UNIVERSITY OF NORTH FLORIDA   (United States)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^c UNIVERSITY OF APPLIED SCIENCES KOBLENZ   (Germany)

^d UNIVERSITY OF ARKANSAS   (United States)

Author keywords

correlated oxide materials; Raman spectroscopy; thin film substrates

Indexed keywords

GALLIUM COMPOUNDS; LANTHANUM COMPOUNDS; MAGNESIA; NEODYMIUM COMPOUNDS; OXIDE MINERALS; RAMAN SPECTROSCOPY; SINGLE CRYSTALS; STRONTIUM TITANATES; SUBSTRATES; THIN FILMS; TITANIUM DIOXIDE;

COMPLEX OXIDES; CORRELATED OXIDE MATERIAL; FILM RESEARCH; NORMALISATION; OXIDE MATERIALS; REFERENCE MATERIAL; SINGLE-CRYSTAL SUBSTRATES; SPECTRA'S; THIN-FILMS; THINFILM SUBSTRATES;

ALUMINUM COMPOUNDS;

EID: 84902079982     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.4487     Document Type: Article

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