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Volumn 143, Issue , 2014, Pages 15-23

Coordinate transformation based cryo-correlative methods for electron tomography and focused ion beam milling

Author keywords

Correlative microscopy; Cryo electron tomography; Electron tomography; Focused ion beam

Indexed keywords

FOCUSED ION BEAMS; SCANNING ELECTRON MICROSCOPY;

EID: 84900851520     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.11.008     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.