Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples

Journal of Synchrotron Radiation

Volumn 21, Issue 3, 2014, Pages 561-567

  Li, Wen Bin ^a   Yang, Xiao Yue ^a   Zhu, Jing Tao ^a   Tu, Yu Chun ^a   Mu, Bao Zhong ^a   Yu, Hai Sheng ^b   Wei, Xiang Jun ^b   Huang, Yu Ying ^b   Wang, Zhan Shan ^a  

^a TONGJI UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

Author keywords

EXAFS; multilayer; scattering factors; self absorption effects; X ray fluorescence; XRR

Indexed keywords

ABSORPTION SPECTRA; ELECTROMAGNETIC WAVE ATTENUATION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FLUORESCENCE; LIGHT ABSORPTION; X RAYS;

EXAFS; SCATTERING FACTORS; SELF-ABSORPTION EFFECTS; X RAY FLUORESCENCE; XRR;

MULTILAYERS;

EID: 84899825639     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514001970     Document Type: Article

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