Quantitative analysis of anisotropic edge retraction by solid-state dewetting of thin single crystal films

Journal of Applied Physics

Volumn 113, Issue 4, 2013, Pages

  Hyun Kim, Gye ^a   Zucker, Rachel V ^a   Ye, Jongpil ^b   Craig Carter, W ^a   Thompson, Carl V ^a  

^a USA   (United States)

^b Inha University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; DE-WETTING; FILM EDGE; IN-PLANE ORIENTATION; MEASUREMENTS OF; MGO; NI FILMS; OUT-OF-PLANE; SINGLE CRYSTAL THIN FILMS; SINGLE-CRYSTAL FILMS; SURFACE LAPLACIAN; TIME-SCALING; WEIGHTED MEAN CURVATURE; WULFF SHAPE;

ANISOTROPY; EXPERIMENTS; KINETICS;

SINGLE CRYSTALS;

EID: 84873680197     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4788822     Document Type: Article

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